Published June 5, 2012 | Version v1
Journal article Metadata-only

A study on the microstructural parameters of 550 keV electron irradiated Lexan polymer films

Creators

  • 1. Microtron Centre, Department of Physics, Mangalore University, Mangalagangotri-574199 (India)
  • 2. Department of Physics, Mangalore University, Mangalagangotri-574199 (India)
  • 3. PSIA Division, Raja Rammana Centre for Advanced Technology, Indore-452013 (India)

Description

Lexan polymer films irradiated with 550 keV Electron Beam (EB) were characterized using Wide Angle Xray Scattering (WAXS) data to study the microstructural parameters. The crystal imperfection parameters like crystal size , lattice strain (g in %) and enthalpy (α) have been determined by Line Profile Analysis (LPA) using Fourier method of Warren.

Additional details

Identifiers

DOI
10.1063/1.4710139;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1447
Journal Issue
1
Journal Page Range
p. 585-586
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
56. DAE solid state physics symposium 2011
Dates
19-23 Dec 2011
Place
Kattankulathur, Tamilnadu (India)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43094224
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTALS; ELECTRON BEAMS; ELECTRONS; ENTHALPY; FILMS; KEV RANGE; MICROSTRUCTURE; POLYMERS; STRAINS; X-RAY DIFFRACTION
Descriptors DEC
BEAMS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; LEPTON BEAMS; LEPTONS; PARTICLE BEAMS; PHYSICAL PROPERTIES; SCATTERING; THERMODYNAMIC PROPERTIES

Optional Information

Notes
(c) 2012 American Institute of Physics