Development of Electronics for the ATF2 Interaction Point Region Beam Position Monitor

Nanometer resolution beam position monitors have been developed to measure and control beam position stability at the interaction point region of ATF2. The position of the beam has to be measured to within a few nanometers at the interaction point. In order to achieve this performance, electronics for the low-Q IP-BPM was developed. Every component of the electronics have been simulated and checked on the bench and using the ATF2 beam. We will explain each component and define their working range. Then, we will show the performance of the electronics measured with beam signal. ATF2 is a final focus test beam line for ILC in the framework of the ATF international collaboration. The new beam line was constructed to extend the extraction line at ATF, KEK, Japan. The first goal of ATF2 is the acheiving of a 37 nm vertical beam size at focal point (IP). The second goal is to stabilize the beam at the focal point at a few nanometer level for a long period in order to ensure the high luminosity. To achieve these goals a high resolution IP-BPM is essential. In addition for feedback applications a low-Q system is desirable.