Published 2017 | Version v1
Journal article Metadata-only

Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain

Creators

  • 1. Gwangju Institute of Science and Technology (Korea, Republic of). School of Materials Science and Engineering
  • 2. Martin Luther University of Halle-Wittenberg, Halle (Germany). Institute for Physics
  • 3. Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Quantum Condensed Matter Division

Description

In this paper, the tetragonality (c/a) of a PbZr0.2Ti0.8O3 (PZT) thin film on La0.7Sr0.3MnO3/0.72Pb(Mg1/3Nb2/3)O3-0.28PbTiO3 (PMN-PT) substrates was controlled by applying an electric field on the PMN-PT substrate. The piezoelectric response of the PZT thin film under various biaxial strains was observed using time-resolved micro X-ray diffraction. The longitudinal piezoelectric coefficient (d33) was reduced from 29.5 to 14.9 pm/V when the c/a ratio of the PZT film slightly changed from 1.051 to 1.056. Finally, our results demonstrate that the tetragonality of the PZT thin film plays a critical role in determining d33, and in situ strain engineering using electromechanical substrate is useful in excluding the extrinsic effect resulting from the variation in the film thickness or the interface between substrate.

Availability note (English)

Available from http://www.osti.gov/pages/biblio/1340448; DOE Accepted Manuscript full text, or the publishers Best Available Version will be available free of charge after the embargo period

Additional details

Additional titles

Augmented title (English)
KEYWORDS: PZT FILMS; PIEZOELECTRIC FIELDS; PIEZOELECTRIC TRANSDUCERS; FERROELECTRIC THIN FILMS; THIN FILM STRUCTURE

Identifiers

URL
http://www.osti.gov/pages/biblio/1340448;
DOI
10.1063/1.4974450;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
110
Journal Issue
3
Journal Page Range
vp.
ISSN
0003-6951

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
48060565
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ELECTRIC FIELDS; FERROELECTRIC MATERIALS; PIEZOELECTRICITY; PZT; STRAINS; SUBSTRATES; THIN FILMS; TIME RESOLUTION; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIELECTRIC MATERIALS; DIFFRACTION; ELECTRICITY; FILMS; LEAD COMPOUNDS; MATERIALS; OXYGEN COMPOUNDS; RESOLUTION; SCATTERING; TIMING PROPERTIES; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZIRCONATES; ZIRCONIUM COMPOUNDS

Optional Information

Contract/Grant/Project number
AC05-00OR22725; NRF-2014R1A1A3053111; SFB 762
Funding organization
USDOE Laboratory Directed Research and Development (LDRD) Program (United States); National Research Foundation of Korea (NRF) (Korea, Republic of); Gwangju Institute of Science and Technology (Korea, Republic of); POSCO TJ Park Foundation (Korea, Republic of); Deutsche Forschungsgemeinschaft (DFG) (Germany)
Secondary number(s)
OSTIID--1340448