Published January 29, 2014 | Version v1
Journal article

Realizing a family of transition-metal-oxide memristors based on volatile resistive switching at a rectifying metal/oxide interface

  • 1. State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics and Engineering, Sun Yat-sen University, Guangzhou 510275 (China)

Description

There is strong interest in creating new memristors due to their significant impact in many fields including digital information systems, analogue circuits and artificial neural networks as a new class of fundamental electronic elements. Here we report a volatile resistive switching effect at a prototypical Schottky metal/oxide interface and realize a family of transition-metal-oxide memristors showing distinct hysteresis characteristics based on the interface. The results not only provide further understanding on the electrical behaviour of metal/oxide interfaces but also indicate the key role of metal/oxide interfaces as basic building blocks in transition-metal–oxide memristors. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0022-3727/47/4/045108

Additional details

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
47
Journal Issue
4
Journal Page Range
[7 p.]
ISSN
0022-3727
CODEN
JPAPBE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46052516
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
HYSTERESIS; INTERFACES; NEURAL NETWORKS; OXIDES; TRANSITION ELEMENT COMPOUNDS; VOLATILITY
Descriptors DEC
CHALCOGENIDES; OXYGEN COMPOUNDS