Published January 29, 2014
| Version v1
Journal article
Realizing a family of transition-metal-oxide memristors based on volatile resistive switching at a rectifying metal/oxide interface
Creators
- 1. State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics and Engineering, Sun Yat-sen University, Guangzhou 510275 (China)
Description
There is strong interest in creating new memristors due to their significant impact in many fields including digital information systems, analogue circuits and artificial neural networks as a new class of fundamental electronic elements. Here we report a volatile resistive switching effect at a prototypical Schottky metal/oxide interface and realize a family of transition-metal-oxide memristors showing distinct hysteresis characteristics based on the interface. The results not only provide further understanding on the electrical behaviour of metal/oxide interfaces but also indicate the key role of metal/oxide interfaces as basic building blocks in transition-metal–oxide memristors. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/47/4/045108Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 47
- Journal Issue
- 4
- Journal Page Range
- [7 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46052516
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- HYSTERESIS; INTERFACES; NEURAL NETWORKS; OXIDES; TRANSITION ELEMENT COMPOUNDS; VOLATILITY
- Descriptors DEC
- CHALCOGENIDES; OXYGEN COMPOUNDS