Published August 15, 2007
| Version v1
Journal article
Study of magnetic properties and relaxation in amorphous Fe73.9Nb3.1Cu0.9Si13.2B8.9 thin films produced by ion beam sputtering
Creators
- 1. UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452017 (India)
- 2. School of Physics, D.A. University, Indore 452017 (India)
- 3. Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce 91, I-10135 Turin (Italy)
Description
Amorphous Fe73.9Nb3.1Cu0.9Si13.2B8.9 thin films have been produced by ion beam sputtering with two different beam energies (500 and 1000 eV). Magnetic measurements indicate that the samples display a uniaxial magnetic anisotropy, especially for samples prepared with the lower beam energy. Magnetization relaxation has been measured on both films with an alternating gradient force magnetometer and magneto-optical Kerr effect. Magnetization relaxation occurs on time scales of tens of seconds and can be described with a single stretched exponential function. Relaxation intensity turns out to be higher when measured along the easy magnetization axis
Additional details
Identifiers
- DOI
- 10.1063/1.2775537;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 102
- Journal Issue
- 4
- Journal Page Range
- p. 043916-043916.8
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39074729
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; BORON ALLOYS; COPPER ALLOYS; EV RANGE 100-1000; INTERMETALLIC COMPOUNDS; ION BEAMS; IRON ALLOYS; KERR EFFECT; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETO-OPTICAL EFFECTS; MAGNETOMETERS; METALLIC GLASSES; NIOBIUM ALLOYS; RELAXATION; SILICON ALLOYS; SPUTTERING; THIN FILMS
- Descriptors DEC
- ALLOYS; BEAMS; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ENERGY RANGE; EV RANGE; FILMS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- (c) 2007 American Institute of Physics