Published February 1996
| Version v1
Journal article
SMILETRAP - atomic mass measurements with ppb accuracy by using highly charged ions
Creators
- 1. Mainz Univ. (Germany). Inst. fuer Physik
- 2. Stockholm Univ. (Sweden). Atomic Phys.
- 3. Gesellschaft fuer Schwerionenforschung mbH, Darmstadt (Germany)
Description
In the SMILETRAP facility externally produced highly charged ions are captured in a Penning trap and utilized for high precision measurements of atomic masses. Accuracy tests on a ppb level have been performed, using highly charged carbon, oxygen and neon ions. In all cases hydrogen ions served as a reference for the calibration and monitoring of the magnetic field in the trap. Deviations smaller than 3 ppb from the expected results were found in mass measurements of the 16O and 20Ne atomic masses. The proton atomic mass, determined from the reference measurements on hydrogen ions, is in good agreement with the accepted value. A direct mass measurement on the 86Kr-isotope, using trapped 86Kr29+-ions is reported. (orig.)
Additional details
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 99
- Journal Issue
- 1-3
- Journal Page Range
- p. 83-89.
- ISSN
- 0304-3843
- CODEN
- HYINDN
Conference
- Title
- 1. Euroconference on atomic physics with stored highly charged ions.
- Dates
- 20-24 Mar 1995.
- Place
- Heidelberg (Germany).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 27059849
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON BEAM ION SOURCES; HYDROGEN IONS; KRYPTON IONS; MASS SPECTROSCOPY; MULTICHARGED IONS; NEON IONS; OXYGEN IONS
- Descriptors DEC
- CHARGED PARTICLES; ION SOURCES; IONS; SPECTROSCOPY