Published February 1996 | Version v1
Journal article

SMILETRAP - atomic mass measurements with ppb accuracy by using highly charged ions

  • 1. Mainz Univ. (Germany). Inst. fuer Physik
  • 2. Stockholm Univ. (Sweden). Atomic Phys.
  • 3. Gesellschaft fuer Schwerionenforschung mbH, Darmstadt (Germany)

Description

In the SMILETRAP facility externally produced highly charged ions are captured in a Penning trap and utilized for high precision measurements of atomic masses. Accuracy tests on a ppb level have been performed, using highly charged carbon, oxygen and neon ions. In all cases hydrogen ions served as a reference for the calibration and monitoring of the magnetic field in the trap. Deviations smaller than 3 ppb from the expected results were found in mass measurements of the 16O and 20Ne atomic masses. The proton atomic mass, determined from the reference measurements on hydrogen ions, is in good agreement with the accepted value. A direct mass measurement on the 86Kr-isotope, using trapped 86Kr29+-ions is reported. (orig.)

Additional details

Publishing Information

Journal Title
Hyperfine Interactions
Journal Volume
99
Journal Issue
1-3
Journal Page Range
p. 83-89.
ISSN
0304-3843
CODEN
HYINDN

Conference

Title
1. Euroconference on atomic physics with stored highly charged ions.
Dates
20-24 Mar 1995.
Place
Heidelberg (Germany).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
27059849
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON BEAM ION SOURCES; HYDROGEN IONS; KRYPTON IONS; MASS SPECTROSCOPY; MULTICHARGED IONS; NEON IONS; OXYGEN IONS
Descriptors DEC
CHARGED PARTICLES; ION SOURCES; IONS; SPECTROSCOPY