Hot-electron effect in PdAu thin-film resistors with attached cooling fins
- 1. Low Temperature Division, Faculty of Science and Technology, University of Twente, PO Box 217, 7500 AE Enschede (Netherlands)
- 2. Kamerlingh Onnes Laboratory of the Leiden University, PO Box 9504, 2300 RA Leiden (Netherlands)
- 3. Institute of Photonic Technology, PO Box 100239, D-07702 Jena (Germany)
Description
The sensitivity of superconducting electronics operated in the sub-Kelvin temperature range is usually limited by the hot-electron effect. Here, an increased thermal resistance due to a weakened electron-phonon coupling leads to a higher temperature of the electrons in the thin-film shunt resistors of the Josephson junctions. Cooling fins can be attached to weaken this effect. We characterized different configurations of resistors in PdAu with or without attached cooling fins by dissipating power and determining the effective electron temperature. This was done by directly measuring the Johnson noise with a SQUID amplifier. The results are compared to theory and numerical calculations on the electronic heat transport. The latter turns out to be a useful tool for the optimization of the thermal design of superconducting electronics.
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-2048/22/11/114007Additional details
Identifiers
- DOI
- 10.1088/0953-2048/22/11/114007;
- PII
- S0953-2048(09)21878-1;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 22
- Journal Issue
- 11
- Journal Page Range
- [9 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
Conference
- Title
- International superconductive electronics conference 2009
- Acronym
- ISEC 09
- Dates
- 16-19 Jun 2009
- Place
- Fukuoka (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42053381
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMPLIFIERS; COOLING; ELECTRON TEMPERATURE; ELECTRON-PHONON COUPLING; ELECTRONS; FINS; HEAT TRANSFER; JOSEPHSON JUNCTIONS; OPTIMIZATION; RESISTORS; SENSITIVITY; SQUID DEVICES; THIN FILMS
- Descriptors DEC
- COUPLING; ELECTRICAL EQUIPMENT; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ENERGY TRANSFER; EQUIPMENT; FERMIONS; FILMS; FLUXMETERS; LEPTONS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; SUPERCONDUCTING DEVICES; SUPERCONDUCTING JUNCTIONS