Published September 1, 2007
| Version v1
Journal article
Fabrication of back-illuminated, fully depleted charge-coupled devices
- 1. Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States)
Description
We describe a fabrication strategy to produce fully depleted, back-illuminated charge-coupled devices (CCDs). Wafers are partially processed at a commercial foundry using standard processing techniques. The wafers are then thinned to the final desired thickness, and the processing steps necessary to produce back-illuminated devices are performed in our laboratory. The CCDs are then probed at wafer level, and we describe our techniques to screen for gate insulator flaws as well as defects on the back side of the wafer that are important for fully depleted devices
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2007.05.265Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.05.265;
- PII
- S0168-9002(07)01156-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 579
- Journal Issue
- 2
- Journal Page Range
- p. 653-657
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 6. 'Hiroshima' symposium on the development and application of semiconductor detectors
- Dates
- 11-15 Sep 2006
- Place
- Carmel, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39060960
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; DEFECTS; EQUIPMENT; FABRICATION; FOUNDRIES; PROCESSING; SILICON; THICKNESS
- Descriptors DEC
- DIMENSIONS; ELEMENTS; INDUSTRIAL PLANTS; SEMICONDUCTOR DEVICES; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.