Published 1994 | Version v1
Miscellaneous Metadata-only

Study on porous silicon using multiple X-ray diffraction and Raman spectroscopy

Creators

  • 1. Universidade Estadual de Campinas, SP (Brazil). Inst. de Fisica
  • 2. North Carolina Univ., Charlotte, NC (United States). Dept.of Electrical Engineering

Description

Short communication

Part of:
Proceedings of the 17. national meeting on condensed matter physics. Abstracts

Additional details

Additional titles

Original title (Portuguese)
Estudo do silicio poroso por difracao multipla de raios-X e espectroscopia Raman

Publishing Information

Imprint Title
Proceedings of the 17. national meeting on condensed matter physics: abstracts
Imprint Pagination
427 p.
Journal Page Range
p. 72.

Conference

Title
17. Brazilian meeting on condensed matter physics.
Original Conference Title
17. Encontro nacional de fisica da materia condensada
Dates
7-11 Jun 1994.
Place
Caxambu, MG (Brazil).

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
27080099
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, No Abstract, Non-conventional Literature
Descriptors DEI
DIFFRACTION; MATERIALS; POROSITY; POROUS MATERIALS; QUANTITATIVE CHEMICAL ANALYSIS; RADIATIONS; RAMAN EFFECT; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SCATTERING; SEMICONDUCTOR MATERIALS; SILICON; SOLID STATE PHYSICS; SPECTROSCOPY; SURFACE PROPERTIES; X-RAY DIFFRACTION
Descriptors DEC
CHEMICAL ANALYSIS; COHERENT SCATTERING; ELEMENTS; LASER SPECTROSCOPY; PHYSICS; SEMIMETALS; SPECTRA

Optional Information

Notes
Imprint:Anais do 17. encontro nacional de fisica da materia condensada: resumos.