Published December 15, 2009
| Version v1
Journal article
Recent knowledge of strength and dislocation mobility in wide band-gap semiconductors
Creators
- 1. Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)
Description
The mechanical strengths and dislocation activities in wide band-gap semiconductors SiC, AlN, GaN, ZnO and ZnSe at elevated temperatures are summarized. From investigations by indentation hardness test and compressive deformation, activation energies for dislocation motion are evaluated to be 2-2.7, 0.7-1.2 and 0.5-0.7 eV in GaN, ZnO and ZnSe, respectively. Dislocations in II-VI compounds ZnO and ZnSe are essentially mobile.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2009.08.196Additional details
Identifiers
- DOI
- 10.1016/j.physb.2009.08.196;
- PII
- S0921-4526(09)00989-2;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 404
- Journal Issue
- 23-24
- Journal Page Range
- p. 4999-5001
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 25. international conference on defects in semiconductors
- Dates
- 20-24 Jul 2009
- Place
- St. Petersburg (Russian Federation)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41089716
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACTIVATION ENERGY; ALUMINIUM NITRIDES; DEFORMATION; DISLOCATIONS; GALLIUM NITRIDES; MOBILITY; SEMICONDUCTOR MATERIALS; SILICON CARBIDES; STABILITY; ZINC OXIDES; ZINC SELENIDES
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ENERGY; GALLIUM COMPOUNDS; LINE DEFECTS; MATERIALS; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PNICTIDES; SELENIDES; SELENIUM COMPOUNDS; SILICON COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.