Published February 1993
| Version v1
Miscellaneous
Structural characterization of epitaxial thin films by reciprocal space mapping
Description
Short communication
Additional details
Publishing Information
- Imprint Title
- Sixth Israel materials engineering conference IMEC VI
- Imprint Pagination
- 230 p.
- Journal Page Range
- (pt.4.3) p. 3.
- Report number
- INIS-mf--13696
Conference
- Title
- 6. Israel materials engineering conference (IMEC VI).
- Dates
- 24-25 Feb 1993.
- Place
- Dead Sea (Israel).
INIS
- Country of Publication
- Israel
- Country of Input or Organization
- Israel
- INIS RN
- 24065778
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- STRUCTURAL CHEMICAL ANALYSIS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; FILMS; SCATTERING