Published January 2001 | Version v1
Journal article Metadata-only

Precision Measurement of the Charged Pion Mass by High Resolution X-Ray Spectroscopy

Creators

  • 1. Institut fuer Kernphysik, Forschungszentrum Juelich (Germany)
  • 2. Ecole Normale Superieure et Universite Pierre et Marie Curie, Laboratoire Kastler-Brossel, Unite Mixte de Recherche du CNRS no C8552 (France)
  • 3. University of Ioannina, Department of Material Science (Greece)
  • 4. Institut de Physique de l'Universite de Neuchatel (Switzerland)
  • 5. Paul Scherrer Institut (Switzerland)
  • 6. University of Leicester, Department of Physics and Astronomy (United Kingdom)

Description

A new experiment for a high-precision measurement of the pion mass at a 1 ppm level is presented. It combines an improved cyclotron trap that produces pionic and muonic atoms in a small volume with a doubly focusing crystal spectrometer to measure the corresponding exotic X-ray transitions with high accuracy and a novel type of CCD detector. The muonic X-rays lines serve as highly accurate calibration lines. The measurement has been accomplished recently. A detailed analysis of the data is on the way

Additional details

Identifiers

DOI
10.1023/A:1011967821361;

Publishing Information

Journal Title
Hyperfine Interactions
Journal Volume
132
Journal Issue
1-4
Journal Page Range
p. 195-207
ISSN
0304-3843
CODEN
HYINDN

Conference

Title
52. ASMS conference of mass spectrometry and allied topics
Acronym
APAC2000
Dates
19-23 Sep 2000
Place
Cargese (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40085668
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; CALIBRATION; CHARGE-COUPLED DEVICES; CYCLOTRONS; MASS; MUONIC ATOMS; PIONS; RESOLUTION; SPECTROMETERS; X RADIATION; X-RAY SPECTROSCOPY
Descriptors DEC
ACCELERATORS; ATOMS; BOSONS; CYCLIC ACCELERATORS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; HADRONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MESONS; PSEUDOSCALAR MESONS; RADIATIONS; SEMICONDUCTOR DEVICES; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2001 Kluwer Academic Publishers