An optimal parametric design to improve chip cooling
Creators
- 1. Department of Engineering and System Science, National Tsing Hua University, Taiwan (China)
- 2. Department of Business Administration, Shu-Te University, Taiwan (China)
- 3. Department of Mechanical and Automation Engineering, I-Shou University, Kaohsiung County 840, Taiwan (China)
Description
The thermal problems of most electronic components have been solved in recent years by installing various cooling equipments. The passive cooling, which has no need of the fluid-driving devices, can be more reliable and achieved with less cost. In this paper, the Taguchi's method is applied on the optimization of the passive cooling for electronic systems, and a representative CFD (computational fluid dynamic) model is selectively implemented for statistical analysis. The selected parameters in this study are the power density, mother board orientation, chip geometry, opening between chips and the flow pattern. The optimal combination for thermal cooling is obtained by using a two-level statistical approach. Analysis results indicate that about 50% of the effort in performing experiments and simulations can be saved. Further, the results confirmed that the most important parameters affecting the thermal behaviors are the openings in the mother board, power density, and the flow pattern in sequence. Finally, the concept of opening increases the reliability, reduces the manufacturing cost, and simplifies the assembly procedures
Additional details
Identifiers
- DOI
- 10.1016/j.applthermaleng.2007.01.012;
- PII
- S1359-4311(07)00032-4;
Publishing Information
- Journal Title
- Applied Thermal Engineering
- Journal Volume
- 27
- Journal Issue
- 11-12
- Journal Page Range
- p. 1823-1831
- ISSN
- 1359-4311
- CODEN
- ATENFT
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38089340
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- COOLING; COST; DESIGN; EQUIPMENT; FLUIDS; MANUFACTURING; OPTIMIZATION; POWER DENSITY; RELIABILITY; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.