Published June 9, 2014
| Version v1
Journal article
Quasi-Moseley's law for strong narrow bandwidth soft x-ray sources containing higher charge-state ions
Creators
- 1. Department of Advanced Interdisciplinary Sciences, Center for Optical Research and Education (CORE), Utsunomiya University, Utsunomiya, Tochigi 321-8585 (Japan)
- 2. School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000 (China)
- 3. School of Physics, University College Dublin, Belfield, Dublin 4 (Ireland)
- 4. Department of Electrical Engineering, Nagaoka University of Technology, Nagaoka, Niigata 940-2188 (Japan)
- 5. HiLASE Project, Institute of Physics, Academy of Sciences CR, Na Slovance 2, 18221 Prague 8 (Czech Republic)
- 6. National Institute for Fusion Science, Toki, Gifu 509-5292 (Japan)
- 7. Faculty of Science and Technology, Sophia University, Chiyoda, Tokyo 102-8554 (Japan)
Description
Bright narrow band emission observed in optically thin plasmas of high-Z elements in the extreme ultraviolet spectral region follows a quasi-Moseley's law. The peak wavelength can be expressed as λ=(21.86±12.09)×R∞−1×(Z−(23.23±2.87))−(1.52±0.12), where R∞ is the Rydberg constant. The wavelength varies from 13.5 nm to 4.0 nm as the atomic number, Z, increases from Z = 50 to Z = 83. The range of emission wavelengths available from hot optically thin plasmas permits the development of bright laboratory-scale sources for applications including x-ray microscopy and x-ray absorption fine structure determination.
Additional details
Identifiers
- DOI
- 10.1063/1.4883475;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 23
- Journal Page Range
- p. 234107-234107.5
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46006170
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION; CHARGE STATES; EMISSION; FINE STRUCTURE; FUNDAMENTAL CONSTANTS; IONS; MICROSCOPY; OPTICALLY THIN PLASMA; SOFT X RADIATION; ULTRAVIOLET SPECTRA; WAVELENGTHS
- Descriptors DEC
- CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; PLASMA; RADIATIONS; SORPTION; SPECTRA; X RADIATION
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC