Published December 2008 | Version v1
Journal article Metadata-only

Application of dynamic impedance spectroscopy to atomic force microscopy

Creators

  • 1. Department of Electrochemistry, Corrosion and Materials Engineering, Gdansk University of Technology, Narutowicza Street 11/12, 80-952 Gdansk Wrzeszcz (Poland)
  • 2. Department of Materials Engineering, Warsaw University of Technology, Woloska Street 144, 02-507 Warsaw (Poland)

Description

Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.

Availability note (English)

Available from http://dx.doi.org/10.1088/1468-6996/9/4/045006

Additional details

Identifiers

DOI
10.1088/1468-6996/9/4/045006;

Publishing Information

Journal Title
Science and Technology of Advanced Materials
Journal Volume
9
Journal Issue
4
Journal Page Range
[5 p.]
ISSN
1468-6996

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41004164
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; ELECTRICAL PROPERTIES; IMPEDANCE; SPATIAL DISTRIBUTION; SPECTROSCOPY; SURFACES
Descriptors DEC
DISTRIBUTION; MICROSCOPY; PHYSICAL PROPERTIES