Published July 1, 1989
| Version v1
Journal article
X-ray phase determination in multilayers
- 1. CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Service de Physique du Solide et de Resonance Magnetique
- 2. Aix-Marseille-3 Univ., 13 - Marseille (France). Lab. de Physique des Interactions Photons-Matiere
Description
A procedure is described for the determination of the phases of waves scattered by a multilayer structure using interference between surface reflections and structure diffraction. The applicability of the method to Langmuir-Blodgett and metallic sputtered multilayers is discussed. (orig.)
Additional details
Publishing Information
- Journal Title
- Acta Crystallographica, Section A: Foundations of Crystallography
- Journal Volume
- 45
- Journal Issue
- 7
- Series
- Acta Crystallogr., Sect. A: Found. Crystallogr.
- Journal Page Range
- 445-453
- ISSN
- 0108-7673
- CODEN
- ACACE
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 21000325
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL STRUCTURE; INTERFACES; LAYERS; MATHEMATICAL MODELS; MEASURING METHODS; REFLECTION; SPUTTERING; SURFACES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; SCATTERING