UV-laser-assisted processing of thin silicon-germanium-carbon films
- 1. Dpto. Fisica Aplicada, Universidade de Vigo, E.T.S.I Industriales, Rua Maxwell s/n Campus Universitario Lagoas Marcosende, E-36310 Vigo (Spain)
Description
The aim of enhancing the performance of solar cells and microelectronic devices through band-gap engineering as well as the demand of using cheap organic substrates or advanced materials like 'high-k dielectrics' for nanoelectronic based technologies has caused an increasing attention in alternative processes for growing thin silicon-germanium-carbon alloys. Laser-induced chemical vapour deposition (LCVD), excimer laser-assisted crystallisation (ELC) and pulsed laser-induced epitaxy (PLIE) are such alternative techniques that are relatively cheap and capable to provide films in a wide range of composition and crystalline structure. This contribution shows some typical results achieved combining these laser-assisted techniques, thus demonstrating the potential of integrated laser-assisted 'single-chamber' processes. The growth of amorphous hydrogenated SiGeC coatings at 250 deg. C with, on nanometer-scale, well-tailored thickness on large area as well as on small selected areas using LCVD is presented and discussed. The subsequent irradiation of these films in a single-chamber process for the dehydrogenation of the amorphous material, the modification of these coatings to polycrystalline or nanocrystalline films via ELC or to heteroepitaxial alloys on Si(100) wafers through PLIE, is also shown and evaluated. The selected samples that will be shown have been extensively studied through Fourier transform infrared and X-ray photoelectron spectroscopy, time of flight secondary ion mass spectrometry, Rutherford backscattering, X-ray diffraction, atomic force microscopy and scanning electron as well as conventional and high-resolution transmission electron microscopy
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.07.351;
- PII
- S0040-6090(05)02010-9;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 508
- Journal Issue
- 1-2
- Journal Page Range
- p. 48-52
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 4. international conference on silicon epitaxy and heterostructures
- Acronym
- ICSI-4
- Dates
- 23-26 May 2005
- Place
- Awaji Island, Hyogo (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38004679
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBON; CHEMICAL VAPOR DEPOSITION; EPITAXY; EXCIMER LASERS; FILMS; FOURIER TRANSFORMATION; GERMANIUM; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; SOLAR CELLS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHEMICAL COATING; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DEPOSITION; DIFFRACTION; DIRECT ENERGY CONVERTERS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; EQUIPMENT; GAS LASERS; INTEGRAL TRANSFORMATIONS; LASERS; METALS; MICROSCOPY; NONMETALS; PHOTOELECTRIC CELLS; PHOTOELECTRON SPECTROSCOPY; PHOTOVOLTAIC CELLS; SCATTERING; SEMIMETALS; SOLAR EQUIPMENT; SPECTROSCOPY; SURFACE COATING; TRANSFORMATIONS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.