Development of a high-energy transmission LAUE diffraction setup using a medical linac
- 1. Institute of Physics, Bhubaneswar (India)
- 2. School of Applied Science, Centurion University, Bhubaneswar (India)
- 3. Hemalata Hospitals and Research Centre, Bhubaneswar (India)
- 4. Department of Environmental Science, Sambalpur University, Sambalpur (India)
Description
In the present experimental setup, High-energy X-ray (HEX-ray) generated from a Linear Accelerator (LINAC) was used for the development of High-Energy Transmission Laue Diffraction (HETLD) setup. The HETLD is an useful experimental technique for the structural characterization of challenging materials such as liquids, amorphous, nanomaterials etc. High-energy X-rays are very hard X-rays, with typical energies of 60-1000 keV about one order of magnitude higher than conventional X-rays. The HEX-rays bear unique advantage over conventional hard X-rays for the analysis of advanced materials. HEXray generated using a medical LINAC set at 6MV was used in the present setup of HETLD. Again, the HETLD is a tool for mapping grain-level orientation and strain in thicker metallic polycrystals. Preliminary trial run of high-energy X-ray diffraction were presented. (author)
Additional details
Publishing Information
- Publisher
- Raja Ramanna Centre for Advanced Technology
- Imprint Place
- Indore (India)
- Imprint Title
- Proceedings of the eighth DAE-BRNS Indian particle accelerator conference
- Imprint Pagination
- 1194 p.
- Journal Page Range
- p. 1121-1122
Conference
- Title
- 8. DAE-BRNS Indian particle accelerator conference
- Acronym
- InPAC-2018
- Dates
- 9-12 Jan 2018
- Place
- Indore (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 49078501
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GRAIN SIZE; LAUE METHOD; LINEAR ACCELERATORS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- ACCELERATORS; COHERENT SCATTERING; DIFFRACTION; DIFFRACTION METHODS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MICROSTRUCTURE; RADIATIONS; SCATTERING; SIZE
Optional Information
- Notes
- 3 refs., 2 figs.