Published September 15, 2009
| Version v1
Journal article
Surface chemistry dependence of native oxidation formation on silicon nanocrystals
- 1. Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455 (United States)
- 2. Department of Mechanical Engineering, University of Minnesota, Minneapolis, Minnesota 55455 (United States)
Description
The growth of silicon oxide on bare and SF6-etched silicon nanocrystals (Si-NCs), which were synthesized by an all gas phase approach, was investigated by examining the surface chemistry and optical properties of the NCs over time. Consistent with previous work in the low temperature oxidation of silicon, the oxidation follows the Cabrera-Mott mechanism, and the measured data are well fitted to the Elovich equation. The use of the SF6 plasma is found to reduce the surface Si-H bond density and dramatically increase the monolayer growth rate. This is believed to be due to the much larger volatility of Si-F bonds compared to Si-H bonds on the surface of the NC.
Additional details
Identifiers
- DOI
- 10.1063/1.3225570;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 106
- Journal Issue
- 6
- Journal Page Range
- p. 064313-064313.5
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41096397
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CRYSTAL GROWTH; EQUATIONS; FOURIER TRANSFORMATION; INFRARED SPECTRA; NANOSTRUCTURES; OPTICAL PROPERTIES; OXIDATION; PLASMA; SEMICONDUCTOR MATERIALS; SILICON; SILICON OXIDES; SPUTTERING; VOLATILITY
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; ELEMENTS; INTEGRAL TRANSFORMATIONS; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SEMIMETALS; SILICON COMPOUNDS; SPECTRA; TRANSFORMATIONS
Optional Information
- Notes
- (c) 2009 American Institute of Physics