Effects of Al doping concentration on optical parameters of ZnO:Al thin films by sol-gel technique
- 1. International Center for Material Physics, Chinese Academy of Sciences, Shengyang 110015 (China)
- 2. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054 (China)
- 3. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054 (China) and Department of Physics, Zhanjiang Normal College, Zhanjiang 524048 (China)
- 4. Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900 (China)
Description
ZnO:Al thin films doped with different aluminum concentration were deposited on (0 0 0 1) sapphire substrates by sol-gel technique. Kramers-Kronig relationship was used to determine the optical parameters of ZnO:Al thin films in wavelengths with a range of 300-600 nm. Calculated results show that all optical parameters keep constant in the visible region. The refractive index, the extinction coefficient and the real and imaginary components of dielectric are ∼1.6, ∼0.08, ∼2.5, and ∼0.27, respectively. Optical constants change distinctly near the optical absorption edge. In the ultraviolet region, doping concentration strongly affects the optical parameters of ZnO:Al thin films. Optical parameters tend to decrease with increasing doping concentration
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2006.01.342;
- PII
- S0921-4526(06)00201-8;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 381
- Journal Issue
- 1-2
- Journal Page Range
- p. 209-213
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37073325
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION; ALUMINIUM; DOPED MATERIALS; KRAMERS-KRONIG CORRELATION; PERMITTIVITY; REFRACTIVE INDEX; SAPPHIRE; SOL-GEL PROCESS; SUBSTRATES; THIN FILMS; ULTRAVIOLET RADIATION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CORRELATIONS; CORUNDUM; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; MATERIALS; METALS; MINERALS; OPTICAL PROPERTIES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SORPTION; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.