Monte Carlo simulation of X/γ-ray spectrum measured by SDD detector

Published August 2024 | Version v1

Journal article Metadata-only

1. University of Toyama, Graduate School of Science and Engineering, Toyama (Japan)
2. National Institute of Technology, Toyama College, Department of Electronics and Computer Engineering, Toyama (Japan)

no abstract available

Availability note (English)

Available from DOI: https://doi.org/10.50955/happyokai.4.0_48

Journal Title: Aisotopu, Hoshasen Kenkyu Happyokai
Journal Volume: 4
Series: 雑誌名:アイソトープ・放射線研究発表会; The Annual Meeting on Radioisotopes and Radiation Researches
Journal Page Range: 1 p.
ISSN: 2436-4487

Country of Publication: Japan
Country of Input or Organization: Japan
INIS RN: 56002414
Subject category: S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator: Conference, No Abstract
Descriptors DEI: COBALT 57; G CODES; GAMMA SPECTRA; KEV RANGE 01-10; KEV RANGE 10-100; MONTE CARLO METHOD; RADIATION METROLOGY; RADIATION SOURCES; RADIATIVE CORRECTIONS; SI SEMICONDUCTOR DETECTORS; VACUUM PUMPS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
Descriptors DEC: BETA DECAY RADIOISOTOPES; CALCULATION METHODS; CHEMICAL ANALYSIS; COBALT ISOTOPES; COMPUTER CODES; CORRECTIONS; DAYS LIVING RADIOISOTOPES; ELECTRON CAPTURE RADIOISOTOPES; ENERGY RANGE; EQUIPMENT; INTERMEDIATE MASS NUCLEI; ISOTOPES; KEV RANGE; LABORATORY EQUIPMENT; MEASURING INSTRUMENTS; METROLOGY; NONDESTRUCTIVE ANALYSIS; NUCLEI; ODD-EVEN NUCLEI; PUMPS; RADIATION DETECTORS; RADIOISOTOPES; SEMICONDUCTOR DETECTORS; SPECTRA; X-RAY EMISSION ANALYSIS