Published May 2019 | Version v1
Journal article

Sample cutting-free pole figure measuring method for centreless diffractometers in modified X mode

  • 1. University of Miskolc, Institute of Physical Metallurgy Metalforming and Nanotechnology, Miskolc-Egyetemvaros, H3515 (Hungary)

Description

Highlights: • A new pole figure measurement method is presented developed for centreless X-ray diffractometers. • The method inherits all benefits of centreless diffractometers: no sample cutting, no size/geometry limit, portability. • Results obtained with the presented method gave similar results with those of conventional pole figure measurement method. -- Abstract: Conventional X-ray diffraction-based pole figure measurements are realized with dedicated equipment which are accompanied with certain limitations such as sample size, geometry, and no option for on-site measurements. These restrictions limit the availability of texture measurements in cases when sample cutting from the object of interest is not allowed. Within this manuscript, a novel method is described with which pole figure measurements can be realized using centreless diffractometers originally developed for residual stress measurements. The theoretical background of the proposed method is presented in detail. Instances of pole figures obtained with the described method are presented and compared to conventional ones. It was concluded that the presented method is applicable to measure pole figures in a reliable manner with all the benefits of centreless diffractometers: no need for sample cutting, large geometrical freedom and the possibility for on-site measurements.

Additional details

Identifiers

DOI
10.1016/j.matchar.2019.03.031;
PII
S1044580318324483;

Publishing Information

Journal Title
Materials Characterization
Journal Volume
151
Journal Page Range
p. 351-357
ISSN
1044-5803
CODEN
MACHEX

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55030989
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
GEOMETRY; MEASURING METHODS; RESIDUAL STRESSES; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; MATHEMATICS; MEASURING INSTRUMENTS; SCATTERING; STRESSES

Optional Information

Copyright
Copyright (c) 2019 Elsevier Inc. All rights reserved.