Sample cutting-free pole figure measuring method for centreless diffractometers in modified X mode
- 1. University of Miskolc, Institute of Physical Metallurgy Metalforming and Nanotechnology, Miskolc-Egyetemvaros, H3515 (Hungary)
Description
Highlights: • A new pole figure measurement method is presented developed for centreless X-ray diffractometers. • The method inherits all benefits of centreless diffractometers: no sample cutting, no size/geometry limit, portability. • Results obtained with the presented method gave similar results with those of conventional pole figure measurement method. -- Abstract: Conventional X-ray diffraction-based pole figure measurements are realized with dedicated equipment which are accompanied with certain limitations such as sample size, geometry, and no option for on-site measurements. These restrictions limit the availability of texture measurements in cases when sample cutting from the object of interest is not allowed. Within this manuscript, a novel method is described with which pole figure measurements can be realized using centreless diffractometers originally developed for residual stress measurements. The theoretical background of the proposed method is presented in detail. Instances of pole figures obtained with the described method are presented and compared to conventional ones. It was concluded that the presented method is applicable to measure pole figures in a reliable manner with all the benefits of centreless diffractometers: no need for sample cutting, large geometrical freedom and the possibility for on-site measurements.
Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2019.03.031;
- PII
- S1044580318324483;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 151
- Journal Page Range
- p. 351-357
- ISSN
- 1044-5803
- CODEN
- MACHEX
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55030989
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- GEOMETRY; MEASURING METHODS; RESIDUAL STRESSES; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; MATHEMATICS; MEASURING INSTRUMENTS; SCATTERING; STRESSES
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier Inc. All rights reserved.