Published January 19, 2007 | Version v1
Journal article

Quickly Getting the Best Data from Your Macromolecular Crystals with a New Generation of Beamline Instruments

  • 1. EMBL-Grenoble, 6, rue Jules Horowitz, BP181 38042 Grenoble Cedex 9 (France)
  • 2. MRC-France (BM14), c/o ESRF, B.P.220, 38043 Grenoble CEDEX (France)
  • 3. ESRF, B.P. 220, 38043 Grenoble CEDEX (France)

Description

While routine Macromolecular x-ray (MX) crystallography has relied on well established techniques for some years all the synchrotrons around the world are improving the throughput of their MX beamlines. Third generation synchrotrons provide small intense beams that make data collection of 5-10 microns sized crystals possible. The EMBL/ESRF MX Group in Grenoble has developed a new generation of instruments to easily collect data on 10 μm size crystals in an automated environment. This work is part of the Grenoble automation program that enables FedEx like crystallography using fully automated data collection and web monitored experiments. Seven ESRF beamlines and the MRC BM14 ESRF/CRG beamline are currently equipped with these latest instruments. We describe here the main features of the MD2x diffractometer family and the SC3 sample changer robot. Although the SC3 was primarily designed to increase the throughput of MX beamlines, it has also been shown to be efficient in improving the quality of the data collected. Strategies in screening a large number of crystals, selecting the best, and collecting a full data set from several re-oriented micro-crystals can now be run with minimum time and effort. The MD2x and SC3 instruments are now commercialised by the company ACCEL GmbH

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
879
Journal Issue
1
Journal Page Range
p. 1928-1931
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. international conference on synchrotron radiation instrumentation
Dates
28 May - 2 Jun 2006
Place
Daegu (Korea, Republic of)

Optional Information

Notes
(c) 2007 American Institute of Physics