Published June 2012 | Version v1
Journal article

Wavelet-transform-based time–frequency domain reflectometry for reduction of blind spot

  • 1. Department of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-Gu, Seoul 120-749 (Korea, Republic of)
  • 2. Department of Electronic Engineering, Kyonggi University, Suwon, Kyonggi-Do 443-760 (Korea, Republic of)

Description

In this paper, wavelet-transform-based time–frequency domain reflectometry (WTFDR) is proposed to reduce the blind spot in reflectometry. TFDR has a blind spot problem when the time delay between the reference signal and the reflected signal is short enough compared with the time duration of the reference signal. To solve the blind spot problem, the wavelet transform (WT) is used because the WT has linearity. Using the characteristics of the WT, the overlapped reference signal at the measured signal can be separated and the blind spot is reduced by obtaining the difference of the wavelet coefficients for the reference and reflected signals. In the proposed method, the complex wavelet is utilized as a mother wavelet because the reference signal in WTFDR has a complex form. Finally, the computer simulations and the real experiments are carried out to confirm the effectiveness and accuracy of the proposed method. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/23/6/065004

Additional details

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
23
Journal Issue
6
Journal Page Range
[11 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46016148
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; DATA PROCESSING; MEASURING METHODS; OPTICAL EQUIPMENT; SIGNALS; SPECTRAL REFLECTANCE; TIME DELAY
Descriptors DEC
EQUIPMENT; EVALUATION; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PROCESSING; SIMULATION