Wavelet-transform-based time–frequency domain reflectometry for reduction of blind spot
Creators
- 1. Department of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-Gu, Seoul 120-749 (Korea, Republic of)
- 2. Department of Electronic Engineering, Kyonggi University, Suwon, Kyonggi-Do 443-760 (Korea, Republic of)
Description
In this paper, wavelet-transform-based time–frequency domain reflectometry (WTFDR) is proposed to reduce the blind spot in reflectometry. TFDR has a blind spot problem when the time delay between the reference signal and the reflected signal is short enough compared with the time duration of the reference signal. To solve the blind spot problem, the wavelet transform (WT) is used because the WT has linearity. Using the characteristics of the WT, the overlapped reference signal at the measured signal can be separated and the blind spot is reduced by obtaining the difference of the wavelet coefficients for the reference and reflected signals. In the proposed method, the complex wavelet is utilized as a mother wavelet because the reference signal in WTFDR has a complex form. Finally, the computer simulations and the real experiments are carried out to confirm the effectiveness and accuracy of the proposed method. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/23/6/065004Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 23
- Journal Issue
- 6
- Journal Page Range
- [11 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46016148
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; DATA PROCESSING; MEASURING METHODS; OPTICAL EQUIPMENT; SIGNALS; SPECTRAL REFLECTANCE; TIME DELAY
- Descriptors DEC
- EQUIPMENT; EVALUATION; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PROCESSING; SIMULATION