Fluctuation effect of point defect reaction on nucleation of interstitial clusters during neutron irradiation
- 1. Dept. of Nuclear Engineering, School of Engineering, Nagoya Univ. (Japan)
- 2. Dept. of Precision Engineering, Faculty of Engineering, Hokkaido Univ., Sapporo (Japan)
Description
Effects of stochastic fluctuation of point defect reaction on the destination of small interstitial clusters were discussed. Nuclei of interstitial clusters are known to be formed directly from cascade collisions during neutron irradiation. However, the number of experimentally observed interstitial clusters is always much less than the number of cascade collisions in all the materials observed. Success fraction of interstitial cluster nuclei for growth was less than 1/10 in thin foil irradiated samples and less than 1/1000 in bulk irradiated samples, even in the atmosphere of excess free interstitials. These results cannot be explained by rate theory, and stochastic fluctuation of the absorption of free vacancies and interstitials is expected to be playing the major role. The repetition of the shrinkage and growth can make most of the small interstitial clusters produced by cascade collision shrink to zero size. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 191-194
- Journal Issue
- pt.B
- Journal Page Range
- p. 1155-1159.
- ISSN
- 0022-3115
- CODEN
- JNUMAM
Conference
- Title
- 5. international conference on fusion reactor materials (ICFRM-5).
- Dates
- 17-22 Nov 1991.
- Place
- Clearwater, FL (United States).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 24029229
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- DISLOCATIONS; EXPERIMENTAL DATA; FISSION NEUTRONS; FLUCTUATIONS; INTERSTITIALS; MEV RANGE 10-100; NEUTRON FLUENCE; NICKEL; PHYSICAL RADIATION EFFECTS; POINT DEFECTS; SHRINKAGE; STACKING FAULTS; STOCHASTIC PROCESSES; TEMPERATURE RANGE 0400-1000 K; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- BARYONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DATA; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; HADRONS; INFORMATION; LINE DEFECTS; METALS; MEV RANGE; MICROSCOPY; NEUTRONS; NUCLEONS; NUMERICAL DATA; RADIATION EFFECTS; TEMPERATURE RANGE; TRANSITION ELEMENTS; VARIATIONS