Published 2003
| Version v1
Miscellaneous
Schottky barrier and aging effect studies in Au(Cu)/p-CdTe contacts
- 1. Institute of Semiconductor Physics, Kiev (Ukraine)
- 2. Physical and Technological Research and Certification Cntre 'Microanalytics' (PTRCCM), Kiev (Ukraine)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Abstracts of The European Materials Conference E-MRS 2003 Fall Meeting
- Imprint Pagination
- 287 p.
- Journal Page Range
- p. 30
Conference
- Title
- European Materials Conference E-MRS 2003 Fall Meeting
- Dates
- 15-19 Sep 2003
- Place
- Warsaw (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 35101017
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- AGING; CADMIUM TELLURIDES; COPPER; ELECTRIC CONTACTS; ETCHING; FABRICATION; GOLD; HALL EFFECT; INTERFACES; MASS SPECTROSCOPY; MONOCRYSTALS; PHOTOEMISSION; SCANNING ELECTRON MICROSCOPY; SCHOTTKY BARRIER DIODES; SECONDARY BEAMS; STOICHIOMETRY; SURFACE TREATMENTS
- Descriptors DEC
- BEAMS; CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTALS; ELECTRICAL EQUIPMENT; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; EQUIPMENT; METALS; MICROSCOPY; SECONDARY EMISSION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTROSCOPY; SURFACE FINISHING; TELLURIDES; TELLURIUM COMPOUNDS; TRANSITION ELEMENTS