Mechanical and surface properties of Aluminum-Copper-Iron quasicrystal thin films
- 1. Department of Material Science and Engineering, National Tsing Hua University, Hsinchu, 30013 (China)
Description
Highlights: • Growing Al-Cu-Fe thin film quasicrystals using a multilayer structure by sputtering. • The effects of annealing time on the mechanical properties in Al-Cu-Fe thin films quasicrystal. • Understanding the phase transitions of the Al-Cu-Fe multilayers to quasicrystal phase. • The highest contact angle (127°) on record was achieved for a thin film quasicrystal with high hardness. We show quasicrystal formation by annealing multilayers of Al, Cu and Fe. The mechanical and surface properties of quasicrystals are affected by the parameters of annealing process. Here, multilayer Al-Cu-Fe thin film samples with different compositions were sputtered on Si/SiO2 substrates and subjected to a two-step annealing process for different durations (5, 10 and 15 h). X-ray diffraction analyses indicated that the 15-h annealed sample had a sharper quasicrystal peak, which was more stable than any other phases. From the XRD data, the amount of each phase was calculated; the sample with longer annealing duration revealed a high amount of ψ-phase (84.3% crystallinity of quasicrystal) with a small amount of cubic Al50 (CuFe) 50 phase. Nanoindentation tests and contact angle measurements showed that this sample also had the greatest hardness (∼11 GPa) and the highest contact angle (127°), respectively.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2017.10.229Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2017.10.229;
- PII
- S0925838817336654;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 732
- Journal Page Range
- p. 952-957
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53037358
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM COMPOUNDS; ANNEALING; COPPER COMPOUNDS; HARDNESS; IRON COMPOUNDS; LAYERS; PHASE TRANSFORMATIONS; POLYCRYSTALS; PRESSURE RANGE GIGA PA; SILICON OXIDES; SPUTTERING; SUBSTRATES; SURFACE PROPERTIES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; FILMS; HEAT TREATMENTS; MECHANICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PRESSURE RANGE; SCATTERING; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier B.V. All rights reserved.