Published July 3, 2001 | Version v1
Journal article

Primary ion sources for EBIS

  • 1. Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)

Description

This paper gives an introduction into the topic of primary ion sources that can be used to feed ions of normally solid elements into EBIS devices. Starting with a set of typical requirements for primary ion sources, some major types of ion generators are discussed first, with emphasis on their working principles rather than trying to give a fully representative listing of used and proposed generators. Beam-transport issues between primary ion source and EBIS are then examined, and generic characteristics of suitable beam-formation and transport systems are explained

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
572
Journal Issue
1
Journal Page Range
p. 261-271
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
8. international symposium on electron beam ion sources and traps and their applications
Dates
5-8 Nov 2000
Place
Upton, NY (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35062268
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S43: PARTICLE ACCELERATORS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM TRANSPORT; COLLECTIVE ACCELERATORS; ELECTRON BEAM ION SOURCES; ELECTRON BEAMS; PLASMA PRODUCTION
Descriptors DEC
ACCELERATORS; BEAMS; ION SOURCES; LEPTON BEAMS; PARTICLE BEAMS

Optional Information

Notes
(c) 2001 American Institute of Physics.