Low temperature and self catalytic growth of ultrafine ITO nanowires by electron beam evaporation method and their optical and electrical properties
- 1. Department of Physics, Indian Institute of Science Education and Research, Bhopal 462066 (India)
- 2. Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore 560012 (India)
- 3. Nano-Research for Advanced Materials and Technologies, Bangalore 560040 (India)
Description
Highlights: • ITO nanowires were grown by e-beam evaporation method. • ITO nanowires growth done at low substrate temperature of 350 °C. • Nanowires growth was carried out without use of catalyst and reactive oxygen gas. • Nanowires growth proceeds via self catalytic VLS growth. • Grown nanowires have diameter 10–20 nm and length 1–4 μm long. • ITO nanowire films have shown good antireflection property. - Abstract: We report the self catalytic growth of Sn-doped indium oxide (ITO) nanowires (NWs) over a large area glass and silicon substrates by electron beam evaporation method at low substrate temperatures of 250–400 °C. The ITO NWs growth was carried out without using an additional reactive oxygen gas and a metal catalyst particle. Ultrafine diameter (∼10–15 nm) and micron long ITO NWs growth was observed in a temperature window of 300–400 °C. Transmission electron microscope studies confirmed single crystalline nature of the NWs and energy dispersive spectroscopy studies on the NWs confirmed that the NWs growth proceeds via self catalytic vapor-liquid-solid (VLS) growth mechanism. ITO nanowire films grown on glass substrates at a substrate temperature of 300–400 °C have shown ∼2–6% reflection and ∼70–85% transmission in the visible region. Effect of deposition parameters was systematically investigated. The large area growth of ITO nanowire films would find potential applications in the optoelectronic devices
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2014.01.022Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2014.01.022;
- PII
- S0025-5408(14)00034-8;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 52
- Journal Page Range
- p. 167-176
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46051606
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CATALYSTS; DEPOSITION; DOPED MATERIALS; ELECTRICAL PROPERTIES; ELECTRON BEAMS; EVAPORATION; FILMS; LIQUIDS; MICROSTRUCTURE; MONOCRYSTALS; NANOWIRES; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; OXYGEN; PARTICLES; SILICON; SOLIDS; SPECTROSCOPY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; CRYSTALS; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUIDS; LEPTON BEAMS; MATERIALS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; OPTICAL EQUIPMENT; PARTICLE BEAMS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SEMIMETALS; TRANSDUCERS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.