Published June 11, 2007
| Version v1
Journal article
Medipix 2 in X-ray diffraction
Creators
- 1. PANalytical B.V., Lelyweg 1, 7602 EA Almelo (Netherlands)
Description
The Medipix 2 detector is a detector with a high dynamic range and, in principle, no intrinsic detector noise. This makes the detector perfectly suitable for use in X-ray diffraction experiments. For X-ray diffraction systems used in materials science, it is common to use X-rays with an energy of 8keV. When the Medipix 2 read-out chip is bump-bonded to a 300μm silicon sensor it is able to detect these X-rays with a high efficiency. The Medipix 2 detector has been integrated into a PANalytical X'Pert PRO X-ray diffraction system. Details about this integration will be discussed and measurements performed with this system will be shown
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.01.175;
- PII
- S0168-9002(07)00235-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 576
- Journal Issue
- 1
- Journal Page Range
- p. 164-168
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 8. international workshop on radiation imaging detectors
- Dates
- 2-6 Jul 2006
- Place
- Pisa (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38106464
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EFFICIENCY; NOISE; READOUT SYSTEMS; SENSORS; SILICON; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; RADIATIONS; SCATTERING; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.