Published July 2013 | Version v1
Journal article

Directly extracting both threshold voltage and series resistance from the conductance—voltage curve of an AlGaN/GaN Schottky diode

  • 1. Science and Technology on Application Specific Integrated Circuit (ASIC) Laboratory, Hebei Semiconductor Research Institute, Shijiazhuang 050051 (China)
  • 2. School of Physics, Shandong University, Jinan 250100 (China)

Description

An Ni/Au Schottky contact on an AlGaN/GaN heterostructure has been prepared. By using the peak-conductance model, the threshold voltage and the series resistance of the AlGaN/GaN diode are simultaneously extracted from the conductance—voltage (G—V) curve and found to be in good agreement with the ones obtained by using the capacitance—voltage (C—V) curve integration and the plot of dV/d(ln I) versus current I. Thus, a method of directly and simultaneously extracting both the threshold voltage and the series resistance from the conductance—voltage curve for the AlGaN/GaN Schottky diode is developed

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-1056/22/7/077102

Additional details

Publishing Information

Journal Title
Chinese Physics. B
Journal Volume
22
Journal Issue
7
Journal Page Range
[4 p.]
ISSN
1674-1056