Published September 30, 2002 | Version v1
Journal article Metadata-only

Ultrathin ferroelectric strontium bismuth tantalate films

Creators

  • 1. Inst. Ciencia de Materiales de Madrid (C.S.I.C.). Cantoblanco. 28049-Madrid (Spain)

Description

Continuous strontium bismuth tantalate films with an average thickness of ∼36 nm have been prepared by spin-coating deposition of solutions onto Pt/TiO2/SiO2/(100)Si substrates and by rapid thermal processing. The films microstructure was formed by rod-shaped grains and fine equiaxed grains. This densely packed microstructure makes the growth of a continuous ultrathin film possible without shorts in the capacitor. The films exhibited values of coercive field of Ec∼226±40 kV/cm and of remanent polarization of Pr∼7.4±1.5 μC/cm2. They retain their Pr up to ∼105 s and do not fatigue up to ∼1010 cycles

Additional details

Identifiers

DOI
10.1063/1.1506953;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
81
Journal Issue
14
Journal Page Range
p. 2599-2601
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35017739
Subject category
S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
BISMUTH COMPOUNDS; DIELECTRIC MATERIALS; FERROELECTRIC MATERIALS; MICROSTRUCTURE; POLARIZATION; SPIN-ON COATING; STRONTIUM COMPOUNDS; SWITCHES; TANTALATES; THIN FILMS
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; DEPOSITION; DIELECTRIC MATERIALS; ELECTRICAL EQUIPMENT; EQUIPMENT; FILMS; MATERIALS; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; SURFACE COATING; TANTALUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Notes
(c) 2002 American Institute of Physics.