Published November 2016 | Version v1
Journal article

Control of secondary electrons from ion beam impact using a positive potential electrode

  • 1. Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)

Description

Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
87
Journal Issue
11
Journal Page Range
vp.
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48041154
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
AMPLIFICATION; CONTROL; ELECTRIC POTENTIAL; ELECTRODES; ELECTRONS; ERRORS; ION BEAMS; PLATES; POTASSIUM; POTASSIUM IONS; SECONDARY EMISSION; SIGNALS; WIRES
Descriptors DEC
ALKALI METALS; BEAMS; CHARGED PARTICLES; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; IONS; LEPTONS; METALS

Optional Information

Notes
(c) 2016 Author(s)