Published November 2016
| Version v1
Journal article
Control of secondary electrons from ion beam impact using a positive potential electrode
- 1. Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)
Description
Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.
Additional details
Identifiers
- DOI
- 10.1063/1.4960170;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 87
- Journal Issue
- 11
- Journal Page Range
- vp.
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48041154
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AMPLIFICATION; CONTROL; ELECTRIC POTENTIAL; ELECTRODES; ELECTRONS; ERRORS; ION BEAMS; PLATES; POTASSIUM; POTASSIUM IONS; SECONDARY EMISSION; SIGNALS; WIRES
- Descriptors DEC
- ALKALI METALS; BEAMS; CHARGED PARTICLES; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; IONS; LEPTONS; METALS
Optional Information
- Notes
- (c) 2016 Author(s)