Diffusion dynamics of small molecules from mesoporous silicon films by real-time optical interferometry
Creators
Description
Time-dependent laser reflectometry measurements are presented as a means to rigorously characterize analyte diffusion dynamics of small molecules from mesoporous silicon (PSi) films for drug delivery and membrane physics applications. Calculations based on inclusion of a spatially and temporally dependent solute concentration profile in a one-dimensional Fickian diffusion flow model are performed to determine the diffusion coefficients for the selected prototypical polar species, sucrose (340 Da), exiting from PSi films. The diffusion properties of the molecules depend on both PSi pore size and film thickness. For films with average pore diameters between 10-30 nm and film thicknesses between 300-900 nm, the sucrose diffusion coefficient can be tuned between approximately 100 and 550 μm2/s. Extensions of the real-time measurement and modeling approach for determining the diffusivity of small molecules that strongly interact with and corrode the internal surfaces of PSi films are also discussed.
Additional details
Identifiers
- DOI
- 10.1364/AO.50.005329;
Publishing Information
- Journal Title
- Applied Optics
- Journal Volume
- 50
- Journal Issue
- 27
- Journal Page Range
- p. 5329-5337
- ISSN
- 0003-6935
- CODEN
- APOPAI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43126458
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DIFFUSION; FILMS; FLOW MODELS; INCLUSIONS; INTERFEROMETRY; LASER RADIATION; MEMBRANES; MOLECULES; NANOSTRUCTURES; ONE-DIMENSIONAL CALCULATIONS; SACCHAROSE; SILICON; SIMULATION; SURFACES; THICKNESS; TIME DEPENDENCE; TIME MEASUREMENT
- Descriptors DEC
- CARBOHYDRATES; DIMENSIONS; DISACCHARIDES; ELECTROMAGNETIC RADIATION; ELEMENTS; MATHEMATICAL MODELS; OLIGOSACCHARIDES; ORGANIC COMPOUNDS; RADIATIONS; SACCHARIDES; SEMIMETALS
Optional Information
- Notes
- (c) 2011 Optical Society of America