Published November 11, 2000 | Version v1
Journal article

A device for switching small accurate potentials at high voltage

Description

A device is described as that which provides highly precise, switched potentials for the Manitoba II high-resolution, deflection mass spectrometer. In the spectrometer, mass differences (ΔM) of doublets are determined with a precision of δM∼3 parts in 109 of M, the mass at which the doublet occurs, by means of measurements of voltages applied to the plates of the electrostatic analyser. The device described is effective as an RF-based electronic chopper supply, by which these analyser potentials are changed by small (4 mV DC≤ΔV≤2 V DC) amounts, where the two analyser plates operate at nominal values of +400 V DC and -400 V DC with respect to ground. The changes in potential, ΔV, must settle to highly reproducible and precisely determined values (better than 1 μV) within a few milliseconds. For our use in mass comparisons, these potentials are switched cyclically, with equal dwell times of order 40 ms. Since the system uses RF coupling to communicate these values, almost arbitrarily high voltages can be modulated by this method

Additional details

Identifiers

PII
S0168900200004757;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
454
Journal Issue
2-3
Journal Page Range
p. 468-475
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
1. international symposium on applications of particle detectors in medicine, biology and astrophysics (SAMBA)
Dates
6-8 Oct 1999
Place
Siegen (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Romania
INIS RN
34058949
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
HVDC SYSTEMS; MASS RESOLUTION; MASS SPECTROMETERS; MODULATION; RF SYSTEMS; SWITCHES
Descriptors DEC
DC SYSTEMS; ELECTRICAL EQUIPMENT; ENERGY SYSTEMS; EQUIPMENT; MEASURING INSTRUMENTS; POWER SYSTEMS; RESOLUTION; SPECTROMETERS

Optional Information

Copyright
Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.