A device for switching small accurate potentials at high voltage
Creators
Description
A device is described as that which provides highly precise, switched potentials for the Manitoba II high-resolution, deflection mass spectrometer. In the spectrometer, mass differences (ΔM) of doublets are determined with a precision of δM∼3 parts in 109 of M, the mass at which the doublet occurs, by means of measurements of voltages applied to the plates of the electrostatic analyser. The device described is effective as an RF-based electronic chopper supply, by which these analyser potentials are changed by small (4 mV DC≤ΔV≤2 V DC) amounts, where the two analyser plates operate at nominal values of +400 V DC and -400 V DC with respect to ground. The changes in potential, ΔV, must settle to highly reproducible and precisely determined values (better than 1 μV) within a few milliseconds. For our use in mass comparisons, these potentials are switched cyclically, with equal dwell times of order 40 ms. Since the system uses RF coupling to communicate these values, almost arbitrarily high voltages can be modulated by this method
Additional details
Identifiers
- PII
- S0168900200004757;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 454
- Journal Issue
- 2-3
- Journal Page Range
- p. 468-475
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 1. international symposium on applications of particle detectors in medicine, biology and astrophysics (SAMBA)
- Dates
- 6-8 Oct 1999
- Place
- Siegen (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Romania
- INIS RN
- 34058949
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- HVDC SYSTEMS; MASS RESOLUTION; MASS SPECTROMETERS; MODULATION; RF SYSTEMS; SWITCHES
- Descriptors DEC
- DC SYSTEMS; ELECTRICAL EQUIPMENT; ENERGY SYSTEMS; EQUIPMENT; MEASURING INSTRUMENTS; POWER SYSTEMS; RESOLUTION; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.