Raman spectroscopy of Bi2Se3-xTex (x = 0–3) topological insulator crystals
- 1. Academy of Scientific and Innovative Research (AcSIR), Ghaziabad, 201002 (India)
- 2. CSIR-National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi, 110012 (India)
Description
We report crystal growth and Raman spectroscopy characterization of pure and mixed bulk topological insulators Bi2Se3-xTex (x = 0–3). The series comprises of both binary (Bi2Se3, Bi2Te3) and ternary tetradymite (Bi2Se1Te2, Bi2Se2Te1, Bi2Se1·5Te1.5) topological insulators. We analyzed in detail the Raman peaks of vibrational modes viz. out of plane A11g, A12g and in-plane Eg2 for both binary and ternary tetradymite topological insulators. Both out of plane A11g and A12g exhibit obvious atomic size dependent peak shift and the effect is much lesser for the former than the later. The situation is rather interesting for in-plane Eg2, which not only show the shift but rather a broader hump like structure. The de-convolution of the same show two clear peaks, which are understood in terms of the presence of separate in plane Bi–Se(I) and Bi–Te(I) modes in mixed tetradymite (Bi2Se2Te1 and Bi2Se1·5Te1.5) topological insulators. Summarily, various Raman modes of well-characterized pure and mixed topological insulator single crystals are reported and discussed in this article.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2020.412492Additional details
Identifiers
- DOI
- 10.1016/j.physb.2020.412492;
- PII
- S0921452620304920;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 600
- Journal Page Range
- vp.
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54007192
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- BISMUTH SELENIDES; BISMUTH TELLURIDES; CRYSTAL GROWTH; MONOCRYSTALS; RAMAN SPECTROSCOPY; TOPOLOGY; X-RAY DIFFRACTION
- Descriptors DEC
- BISMUTH COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; LASER SPECTROSCOPY; MATHEMATICS; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.