Published October 1992
| Version v1
Journal article
Narrow bandpass layered synthetic microstructure-based pinhole camera to image a tokamak plasma in H-like carbon emission at 34 A
- 1. The Johns Hopkins University, Baltimore, Maryland 21218 (United States)
Description
The layered synthetic microstructure (LSM) technology has made two-dimensional soft x-ray imaging of a tokamak plasma in a single impurity spectral line emission feasible. The curved LSM is used both as an optical filter, with a bandpass in the range of interest on the order of 1.5 A, and as a focusing optic. A detailed design of a narrow bandpass curved LSM-based pinhole camera, which will image the the region from the scrape-off layer 26 cm into the plasma in the DIII-D tokamak plasma in C VI Lyman α emission at 34 A, will be presented
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 63
- Journal Issue
- 10
- Journal Page Range
- p. 5174-5175.
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24017674
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CAMERAS; CARBON IONS; EXTREME ULTRAVIOLET RADIATION; FEASIBILITY STUDIES; OPTICAL FILTERS; PLASMA DIAGNOSTICS; PLASMA IMPURITIES; PLASMA SCRAPE-OFF LAYER; TOKAMAK DEVICES; ULTRAVIOLET SPECTROMETERS
- Descriptors DEC
- BOUNDARY LAYERS; CHARGED PARTICLES; CLOSED PLASMA DEVICES; ELECTROMAGNETIC RADIATION; FILTERS; IMPURITIES; IONS; LAYERS; MEASURING INSTRUMENTS; RADIATIONS; SPECTROMETERS; THERMONUCLEAR DEVICES; ULTRAVIOLET RADIATION