Published July 1988
| Version v1
Journal article
Effect of high-energy heavy-ion irradiation on the properties of copper
- 1. Eoetvoes Lorand Tudomanyegyetem, Budapest (Hungary). Inst. of General Physics
- 2. Eoetvoes Lorand Tudomanyegyetem, Budapest (Hungary). Inst. for Solid State Physics
- 3. Joint Inst. for Nuclear Research, Dubna (USSR)
Description
High-purity polycrystalline copper foils were irradiated with 233 MeV Ne and 443 MeV Ar beams with doses up to 5x1019 ion/m2. At high doses the yield stress, Δσy, approaches to saturation. TEM and electrical resistivity measurements show a monotonous increase of defect density with dose. Dislocation density obtained from X-ray diffraction is low and does not follow this trend. At a dose of 3x1019 Ne/m2 transformation of faulted Frank loops into perfect loops was deduced from TEM studies. The decline of the rate of increase of Δσy is connected with the softening of the obstacles to dislocation movement due to this transformation. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 155-157
- Journal Issue
- pt.B
- Series
- J. Nucl. Mater.
- Journal Page Range
- 1089-1092
- ISSN
- 0022-3115
- CODEN
- JNUMA
Conference
- Title
- 3. international conference on fusion reactor materials (ICFRM-3).
- Dates
- 4-8 Oct 1987.
- Place
- Karlsruhe (Germany, F.R.).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 20011258
- Subject category
- S36: MATERIALS SCIENCE; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ARGON IONS; COPPER; CRYSTAL DEFECTS; DISLOCATIONS; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; HEAVY IONS; MEV RANGE 100-1000; NEON IONS; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; TRANSMISSION ELECTRON MICROSCO; X-RAY DIFFRACTION; YIELD STRENGTH
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DATA; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; INFORMATION; IONS; LINE DEFECTS; MECHANICAL PROPERTIES; METALS; MEV RANGE; MICROSCOPY; NUMERICAL DATA; PHYSICAL PROPERTIES; RADIATION EFFECTS; SCATTERING; TRANSITION ELEMENTS