Significance of decay mechanism into continuum in dynamical Wannier-Stark ladder
- 1. Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, 305-8573 (Japan)
- 2. Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba 305-8573, Japan and Center for computational Sciences, University of Tsukuba, Tsukuba 305-8577 (Japan)
Description
We examine the resonance structure of photodressed electron states of laser-driven Wannier-Stark ladder, namely, dynamic Wannier-Stark ladder, in terms of the excess density of states (DOS) closely related to a lifetime of the state of concern. It is revealed that the resonance structure in the strong laser-field region shows clear dependence on the ratio, η, of a Bloch-frequency to a laser frequency. As the laser strength increases, for η = 1, the excess DOS becomes involved with a lot of newly-growing resonance peaks. This result would be understood from the viewpoint of a Fano-like decay-mechanism caused by a multichannel continuum effect, in marked contrast to the cases of larger η's; for η = 3, the excess DOS just is found to show a pronounced red-shift of a single dominant peak caused by a single-channel continuum effect
Additional details
Identifiers
- DOI
- 10.1063/1.4848375;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1566
- Journal Issue
- 1
- Journal Page Range
- p. 241-242
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 31. international conference on the physics of semiconductors
- Acronym
- ICPS 2012
- Dates
- 29 Jul - 3 Aug 2012
- Place
- Zurich (Switzerland)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45083017
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DENSITY; LASER RADIATION; LASERS; PEAKS; RED SHIFT; RESONANCE
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; PHYSICAL PROPERTIES; RADIATIONS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC