A new method of performance verification for x-ray computed tomography measurements
- 1. Henry Moseley X-ray Imaging Facility, School of Materials, The University of Manchester, Grosvenor Street, Manchester M13 9PL (United Kingdom)
- 2. National FreeForm Centre, National Physical Laboratory, Teddington TW11 0LW (United Kingdom)
- 3. Pariser Building, School of Mechanical, Aerospace and Civil Engineering, The University of Manchester, Manchester M13 9PL (United Kingdom)
Description
Through its ability to measure otherwise inaccessible internal structures, x-ray computed tomography (CT) has become a useful tool in the field of dimensional metrology. However, the lack of international standards for performance verification and the determination of metrological characteristics has so far prevented it from becoming a standardized measurement technology. This paper considers how a test object comprising a dismantleable tetrahedral assembly of four calibrated alumina spheres can be employed to assess the metrological performance of an industrial-type CT system. The measurement accuracy was characterized in terms of sphere size, separation and form errors. In all cases, sub-voxel accuracy was achieved, with errors as small as 1/10 of a voxel being obtained. Good measurement repeatability was demonstrated even upon dismantling and reconstructing the reference object. The tetrahedral test object offers a simple robust solution for the verification of metrological performance with great versatility and adaptability. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/25/6/065401Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 25
- Journal Issue
- 6
- Journal Page Range
- [10 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47067342
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; ALUMINIUM OXIDES; COMPUTERIZED TOMOGRAPHY; ERRORS; PERFORMANCE; SPHERES; X RADIATION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; TOMOGRAPHY