Published September 1990
| Version v1
Journal article
A 45 degree-deflection semiconductor coincidence telescope for 14 MeV neutron yield absolute measurement in an intense neutron generator
Description
A 45 deg-deflection semiconductor coincidence telescope for neutron yield absolute measurement in a 3.3 x 1012 n/s neutron generator is introduced. For neutron yields of 2 x 1010 -3 x 1012 n/s, the intercomparison measurements have been made with a 238U fission chamber and the two methods gave identical results within an error of 4.5%
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 13
- Journal Issue
- 9
- Series
- Nucl. Tech.
- Journal Page Range
- 534-539
- ISSN
- 0253-3219
- CODEN
- NUTED
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 22085881
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COINCIDENCE METHODS; COLLIMATORS; COMPARATIVE EVALUATIONS; CORRECTIONS; EFFICIENCY; ERRORS; MEV RANGE 10-100; NEUTRON GENERATORS; NUCLEAR REACTION YIELD; SHIELDING; SI SEMICONDUCTOR DETECTORS; TELESCOPE COUNTERS; VACUUM SYSTEMS
- Descriptors DEC
- COUNTING TECHNIQUES; ENERGY RANGE; EVALUATION; MEASURING INSTRUMENTS; MEV RANGE; NEUTRON SOURCES; PARTICLE SOURCES; RADIATION DETECTORS; RADIATION SOURCES; SEMICONDUCTOR DETECTORS