Published May 2003
| Version v1
Journal article
Oxidation behavior of Cr films by Nd:YAG pulsed laser
Description
Surface oxidation of Cr films by laser was studied by scanning electron microscope and X-ray diffraction. Oxide growth is homogeneous with long pulse laser (100 μs pulse duration) but it has preferred orientation along (1 1 6) with short pulse laser irradiation (100 ns pulse duration). Lattice contraction results from internal growth stresses
Additional details
Identifiers
- DOI
- 10.1016/S1359-6462(02)00655-3;
- arXiv
- arXiv:cond-mat/0105148v3;
- PII
- S1359646202006553;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 48
- Journal Issue
- 9
- Journal Page Range
- p. 1373-1377
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38055199
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; CONTRACTION; FERRITE GARNETS; FILMS; GRAIN ORIENTATION; LASER RADIATION; LASERS; OXIDATION; PHOTOCHEMISTRY; PROCESSING; PULSES; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SURFACES; X-RAY DIFFRACTION; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; MICROSCOPY; MICROSTRUCTURE; MINERALS; ORIENTATION; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; STRESSES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.