Observations on the growth of Al-Ni-Co decagonal thin films by atomic force microscopy and transmission electron microscopy
- 1. Department of Materials Science and Engineering, Akita University, 1-1 Tegata-gakuen Chou, Akita 010-8502 (Japan)
Description
Thin films of Al-Ni-Co alloy were produced by vacuum deposition technique using a substrate material of amorphous carbon thin-foil. Attempts were made to obtain a homogeneous decagonal quasicrystalline film, where the preparation technique was based on the direct evaporation of pre-alloyed ingot of Al72Ni15Co13 onto the heated substrates. In order to explore early stages of the decagonal film growth, the Al-Ni-Co films with different thicknesses ranging from 2 nm to 30 nm were deposited on either substrates heated at 500 deg. C or non-heated substrates. The film samples so obtained were examined mainly by atomic force microscopy in combination with transmission electron diffraction and imaging techniques. On the basis of these observations, deposition conditions necessary for the growth of decagonal phase in the resulting films as well as the growth mechanism of the decagonal film will be discussed
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2005.03.076;
- PII
- S0925-8388(05)00353-1;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 400
- Journal Issue
- 1-2
- Journal Page Range
- p. 154-162
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37093646
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; ATOMIC FORCE MICROSCOPY; COPPER ALLOYS; ELECTRON DIFFRACTION; EVAPORATION; NICKEL ALLOYS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VACUUM COATING; VAPORS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; FLUIDS; GASES; MICROSCOPY; PHASE TRANSFORMATIONS; SCATTERING; SURFACE COATING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.