Published 2015 | Version v1
Miscellaneous

Synergy of catastrophic failures of semiconductor devices at high-energy ion irradiation

  • 1. Inst. Ionno-Plazmennykh i Lazernykh Tekhnologij ANRUz, Tashkent (Uzbekistan)
  • 2. Helsinki Inst. of Physics and Dept. of Physics, Univ. of Helsinki, Helsinki (Finland)

Description

no abstract available

Part of:
Summaries of reports of XLV International Tulinov conference on physics of interactions of charged particles with crystals

Additional details

Additional titles

Original title (Russian)
Синергетика катастрофических отказов полупроводниковых приборов при высокоэнергетичном ионном облучении

Publishing Information

Publisher
Universitetskaya kniga
Imprint Place
Moscow (Russian Federation)
Imprint Title
Summaries of reports of XLV International Tulinov conference on physics of interactions of charged particles with crystals
Imprint Pagination
190 p.
Journal Page Range
p. 143
Report number
INIS-RU--607

Conference

Title
45. International Tulinov conference on physics of interactions of charged particles with crystals
Original Conference Title
XLV mezhdunarodnaya Tulinovskaya konferentsiya po fizike vzaimodejstviya zaryazhennykh chastits s kristallami
Dates
26-28 May 2015
Place
Moscow (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
49086317
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract, Conference, Numerical Data
Descriptors DEI
FAILURE MODE ANALYSIS; ION BEAMS; MATHEMATICAL MODELS; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DEVICES; THEORETICAL DATA; TIME DEPENDENCE
Descriptors DEC
BEAMS; DATA; INFORMATION; NUMERICAL DATA; RADIATION EFFECTS; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS

Optional Information

Notes
2 refs. Imprint:Tezisy dokladov XLV mezhdunarodnoj Tulinovskoj konferentsii po fizike vzaimodejstviya zaryazhennykh chastits s kristallami