Published October 1989 | Version v1
Report Restricted

Atom probe field-ion microscopy and related topics: A bibliography, 1988

Description

This bibliography includes references related to the following topics: field-ion microscopy (FIM), field emission microscopy (FEM), atom probe field-ion microscopy (APFIM), and liquid metal ion sources (LMIS). Technique-orientated studies and applications are included. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles

Availability note (English)

MF available from INIS under the Report Number; NTIS, PC A03/MF A01 as DE90004388; OSTI; INIS; US Govt. Printing Office Dep.

Files

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Additional details

Publishing Information

Imprint Pagination
50 p.
Report number
ORNL/TM--11370

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21022658
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Bibliography
Descriptors DEI
BIBLIOGRAPHIES; FIELD EMISSION; ION MICROSCOPY; MICROSCOPY; PROBES
Descriptors DEC
DOCUMENT TYPES; EMISSION

Optional Information

Contract/Grant/Project number
Contract AC05-84OR21400