Published 2017 | Version v1
Book

Correlation of mean inner potential depths at a SrTiO3 bicrystal grain boundary annealed at different temperatures with thermal roughnening transition

  • 1. Department of Metallurgical and Materials Engineering, Indian Institute of Technology, Chennai (India)
  • 2. Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul (Korea, Republic of)

Description

By reconstructing exit face wave function using a set of defocused images acquired by Transmission Electron Microscopy, we have measured the projected mean inner potential depth at a grain boundary (GB) in a SrTiO3 bicrystal. As annealing temperature increases, the potential depth at the grain boundary increases, which reveals an exponential profile. For crystalline surfaces, GBs are observed to undergo thermal roughening transition and can be correlated with defaceting transition

Part of:
Proceedings of the international conference on electron microscopy and allied techniques and thirty eighth annual meeting of the Electron Microscope Society of India: souvenir and book of abstracts

Additional details

Publishing Information

Publisher
Indira Gandhi Centre for Atomic Research
Imprint Place
Kalpakkam (India)
Imprint Title
Proceedings of the international conference on electron microscopy and allied techniques and thirty eighth annual meeting of the Electron Microscope Society of India: souvenir and book of abstracts
Imprint Pagination
511 p.
Journal Page Range
p. 118-119

Conference

Title
international conference on electron microscopy and allied techniques; 38. annual meeting of the Electron Microscope Society of India
Acronym
EMSI-2017
Dates
17-19 Jul 2017
Place
Mahabalipuram (India)

Optional Information

Notes
2 refs., 1 fig.