Sensitivity of galaxy cluster dark energy constraints to halo modeling uncertainties
Creators
- 1. Department of Physics, University of Michigan, Ann Arbor, Michigan 48109 (United States)
Description
We perform a sensitivity study of dark energy (DE) constraints from galaxy cluster surveys to uncertainties in the halo mass function, bias, and the mass-observable relation. For a set of idealized surveys, we evaluate cosmological constraints as priors on 16 nuisance parameters in the halo modeling are varied. We find that surveys with a higher mass limit are more sensitive to mass-observable uncertainties while surveys with low mass limits that probe more of the mass-function shape and evolution are more sensitive to mass-function errors. We examine the correlations among nuisance and cosmological parameters. Mass-function parameters are strongly positively (negatively) correlated with ΩDE (w). For the mass-observable parameters, ΩDE is most sensitive to the normalization and its redshift evolution while w is more sensitive to redshift evolution in the variance. While survey performance is limited mainly by mass-observable uncertainties, the current level of mass-function error is responsible for up to a factor of 2 degradation in ideal cosmological constraints. For surveys that probe to low masses (1013.5h-1M·), even percent-level constraints on model nuisance parameters result in a degradation of ∼√(2) (2) on ΩDE (w) relative to perfect knowledge.
Additional details
Identifiers
- DOI
- 10.1103/PhysRevD.81.083509;
- arXiv
- arXiv:0908.0526v2;
Publishing Information
- Journal Title
- Physical Review. D, Particles Fields
- Journal Volume
- 81
- Journal Issue
- 8
- Journal Page Range
- p. 083509-083509.13
- ISSN
- 0556-2821
- CODEN
- PRVDAQ
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42007195
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Descriptors DEI
- CORRELATIONS; GALAXY CLUSTERS; MASS; NONLUMINOUS MATTER; RED SHIFT; SENSITIVITY; SENSITIVITY ANALYSIS; SIMULATION
- Descriptors DEC
- MATTER
Optional Information
- Notes
- (c) 2010 The American Physical Society