Published April 1983 | Version v1
Report Open

Contribution of scanning Auger microscopy to electron beam damage study

Description

Electron bombardment can produce surface modifications of the analysed sample. The electron beam effects on solid surfaces which have been discussed in the published literature can be classified into the following four categories: (1) heating and its consequent effects, (2) charge accumulation in insulators and its consequent effects, (3) electron stimulated adsorption (ESA), and (4) electron stimulated desorption and/or decomposition (ESD). In order to understand the physico-chemical processes which take place under electron irradiation in an Al-O system, we have carried out experiments in which, effects, such as heating, charging and gas contamination, were absent. Our results point out the role of an enhanced surface diffusion of oxygen during electron bombardment of an Al (111) sample. The importance of this phenomenon and the contribution of near-elastic scattering of the primary electrons (5 keV) to the increase of the oxidation degree observed on Al (111) are discussed, compared to the generally studied effects

Availability note (English)

MF available from INIS under the Report Number.

Files

15008924.pdf

Files (1.1 MB)

Name Size Download all
md5:dc3fce9ef80b4854db61d82a67405151
1.1 MB Preview Download

Additional details

Publishing Information

Imprint Pagination
50 p.
Report number
CEA-CONF--6924

Conference

Title
Conference on scanning electron microscopy.
Dates
17-22 Apr 1983.
Place
Dearborn, MI (USA).

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
15008924
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM; AUGER ELECTRON SPECTROSCOPY; CHEMISORPTION; DIFFUSION; MONOCRYSTALS; OXIDATION; OXYGEN; PHYSICAL RADIATION EFFECTS; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY
Descriptors DEC
CHEMICAL REACTIONS; CRYSTALS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; METALS; MICROSCOPY; NONMETALS; RADIATION EFFECTS; SEPARATION PROCESSES; SPECTROSCOPY

Optional Information

Notes
101 refs.