Island growth on solid surfaces unde ion irradiation
Description
The growth of thin solid films on solid surfaces is an industrially wide-spread method to adapt the characteristics of materials to the appropriate needs. The exact control of the evaporating processes is substantial in particular to avoid the formation of islands with epitactic growth. Frequently the irradiation of low-energy ions (with energies below approximately 1 keV) is used for this purpose. A significant change of the island growth on solids can be observed by ion irradiation within the keV energy range. Altogether it can be stated that Helium irradiation increases the islands lateral dimensions when compared to unirradiated samples while at higher temperatures only a slight broadening and flattening of the islands is observed. With Argon irradiation the island diameter stays approximately constant with increasing thickness of the adsorbate. At high temperatures of 550-1260 C of the Knudsen evaporation cell, i.e. high evaporation rates, it can be observed that by using Argon irradiation Bismuth layers originate in contrast to the islands in the not irradiated sample areas. The molecular dynamics simulation showed as an important new effect of irradiation that the islands can melt and evaporate, and may later on condense to the surface. The resulting islands are much broader and flatter than those without irradiation. The newly formed islands show twinning, facetting and clearly visible reordering
Availability note (English)
Available from: http://elib.uni-stuttgart.de/opus/volltexte/2005/2179/Additional details
Additional titles
- Original title (German)
- Inselwachstum auf Festkoerperoberflaechen unter Ionenbestrahlung
Identifiers
Publishing Information
- Imprint Pagination
- 139 p.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 36076356
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Thesis, Non-conventional Literature
- Descriptors DEI
- ADSORPTION; ARGON IONS; ATOMIC FORCE MICROSCOPY; BISMUTH; ELECTRON DIFFRACTION; HELIUM IONS; ION COLLISIONS; KEV RANGE 10-100; LAYERS; MOLECULAR DYNAMICS METHOD; MORPHOLOGY; PHYSICAL RADIATION EFFECTS; SILICON; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; WIDTH
- Descriptors DEC
- CALCULATION METHODS; CHARGED PARTICLES; COHERENT SCATTERING; COLLISIONS; DIFFRACTION; DIMENSIONS; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; METALS; MICROSCOPY; RADIATION EFFECTS; SCATTERING; SEMIMETALS; SORPTION; TEMPERATURE RANGE