A high contrast method of unstained biological samples under a thin carbon film by scanning electron microscopy
Creators
- 1. PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho Kawaguchi, Saitama (Japan)
- 2. Neuroscience Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Central 2, Umezono, Tsukuba, Ibaraki 305-8568 (Japan)
Description
The contrast of biological samples in scanning electron microscopy (SEM) is very weak. To examine a biological specimen by SEM, many steps and/or special equipment are required to prepare the sample. Here, we describe a method using an unstained biological sample under a 40 nm carbon film to give a high contrast image, where the image is detected by the secondary electron (SE) signal at a low accelerating voltage of 1.5 kV. Under these conditions, it is hard to detect a direct signal from a biological specimen. The high contrast image is created by the SEs from the lower surface of the thin carbon film. Therefore, the damage to the sample from the electron beam is very low. Our method can be utilized to observe various biological samples of bacteria, viruses, and protein complexes
Availability note (English)
Available from http://dx.doi.org/10.1016/j.bbrc.2008.09.097Additional details
Identifiers
- DOI
- 10.1016/j.bbrc.2008.09.097;
- PII
- S0006-291X(08)01853-6;
Publishing Information
- Journal Title
- Biochemical and Biophysical Research Communications
- Journal Volume
- 377
- Journal Issue
- 1
- Journal Page Range
- p. 79-84
- ISSN
- 0006-291X
- CODEN
- BBRCA9
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40085903
- Subject category
- S60: APPLIED LIFE SCIENCES;
- Descriptors DEI
- BACTERIA; CARBON; ELECTRON BEAMS; IMAGES; PROTEINS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; VIRUSES
- Descriptors DEC
- BEAMS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; LEPTON BEAMS; MICROORGANISMS; MICROSCOPY; NONMETALS; ORGANIC COMPOUNDS; PARASITES; PARTICLE BEAMS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.