Published December 5, 2008 | Version v1
Journal article

A high contrast method of unstained biological samples under a thin carbon film by scanning electron microscopy

  • 1. PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho Kawaguchi, Saitama (Japan)
  • 2. Neuroscience Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Central 2, Umezono, Tsukuba, Ibaraki 305-8568 (Japan)

Description

The contrast of biological samples in scanning electron microscopy (SEM) is very weak. To examine a biological specimen by SEM, many steps and/or special equipment are required to prepare the sample. Here, we describe a method using an unstained biological sample under a 40 nm carbon film to give a high contrast image, where the image is detected by the secondary electron (SE) signal at a low accelerating voltage of 1.5 kV. Under these conditions, it is hard to detect a direct signal from a biological specimen. The high contrast image is created by the SEs from the lower surface of the thin carbon film. Therefore, the damage to the sample from the electron beam is very low. Our method can be utilized to observe various biological samples of bacteria, viruses, and protein complexes

Availability note (English)

Available from http://dx.doi.org/10.1016/j.bbrc.2008.09.097

Additional details

Identifiers

DOI
10.1016/j.bbrc.2008.09.097;
PII
S0006-291X(08)01853-6;

Publishing Information

Journal Title
Biochemical and Biophysical Research Communications
Journal Volume
377
Journal Issue
1
Journal Page Range
p. 79-84
ISSN
0006-291X
CODEN
BBRCA9

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40085903
Subject category
S60: APPLIED LIFE SCIENCES;
Descriptors DEI
BACTERIA; CARBON; ELECTRON BEAMS; IMAGES; PROTEINS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; VIRUSES
Descriptors DEC
BEAMS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; LEPTON BEAMS; MICROORGANISMS; MICROSCOPY; NONMETALS; ORGANIC COMPOUNDS; PARASITES; PARTICLE BEAMS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.